Test Service
Test Service
Rootsemicon provides professional semiconductor test services dedicated to ensuring the quality of System IC products.
We possess full-cycle testing capabilities, covering the entire process from the design phase to mass production.
Leveraging our high-performance test equipment infrastructure and expert engineering know-how, we deliver customized test solutions to our customers.
One-Stop Test Solution: From Wafer Test to Final Test & Reliability
Equipped with a highly experienced test development team (Many members with 10+ years of expertise).
Differentiated Expertise: Power Devices, Mixed Signal, etc.
Flexible Response Optimized
for Customer Needs.
Global-level expertise in quality and process management.
Tester
Spandnix(SX-3030)
Spandnix(SX-5000)
StarTec (Korea)
SPANDNIX Company Profile
Established | November 12, 1970 |
Capital | JPY 98 Million |
Sales Volume | JPY 1.6 Billion(2016) |
HQ Location | Tokorozawa City, Saitama, Japan |
C.E.O | Takahiro Seki |
Employees | 60 (including 4 Chinese engineers and sales) |
SPANDNIX Company Profile
Old model | SX-1300,SX1600, SX2100 Series : 2000set~ |
Current model | SX-3000 Series : 400set~ SX-5000 Series : 500set~ |
Prober & Handler
● Wafer 테스트 ● Final 테스트
TEL (P8-XL & 12-XL)
STI(AT-468)
SRM(Z-248)
KC8088
STI (Hexa-Maxx)
Main Scope of Test Services
Wafer Level Test (CP / EDS)
ㆍProbe Card Design and Customization
ㆍWafer-Level Electrical Characterization and Yield Analysis
ㆍProvision of Wafer Sort Data (including Yield Map)
Package Level Final Test (FT)
• Digital / Analog / Mixed Signal / Power IC Final Test
• Functional Test, Parametric Test, Burn-in Test
• Handling support by package type (Tray, Tape & Reel, Tube, etc.)
Reliability Test
• Supports various JEDEC standards including HTRB, HTGB, uHAST, PCT, TC, and HTSL
• Provides Pre/Post Test Data Analysis and Failure Analysis (FA) support
Custom Test Solution Development
• Development of Test Programs optimized for customer product characteristics
• Utilizing NI PXI-based test platforms and COTS (Commercial Off-The-Shelf) platforms
• Support for establishing a Turnkey Test Flow
Test Service Capabilities and Development Scope
High-Speed, High-Precision Test Program Development
Secured specialized test know-how for power devices (SiC MOSFET / Diode / IGBT, etc.)
Expertise in optimizing Analog / Mixed Signal IC tests.
High-Reliability Testing Capability for High-Temp / High-Voltage Conditions
Providing feedback based on test data analysis to drive process improvements.
#2720, Sambo Techno Tower, 122, Jomaru-ro 385beon-gil, Wonmi-gu, Bucheon-si, Gyeonggi-do, 14556, Korea
Tel. 070-4349-0077 l Fax. 02-6280-2023
E-mail. rootsemi@rootsemicon.co.kr
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