Test Service

Test Service

Rootsemicon provides professional semiconductor test services dedicated to ensuring the quality of System IC products. 
We possess full-cycle testing capabilities, covering the entire process from the design phase to mass production. 
Leveraging our high-performance test equipment infrastructure and expert engineering know-how, we deliver customized test solutions to our customers.

One-Stop Test Solution: From Wafer Test to Final Test & Reliability

Equipped with a highly experienced test development team (Many members with 10+ years of expertise).

Differentiated Expertise: Power Devices, Mixed Signal, etc.

Flexible Response Optimized 
for Customer Needs.

Global-level expertise in quality and process management.

Tester

Spandnix(SX-3030)

  • V/I Power Supply 256pins (Max)Simultaneous 
  • Measurement 32EA (Max)
  • Device Connection 8units (Max)

Spandnix(SX-5000)

  • SVI: 16ch +64V / -32V / 128m
  • AMVI: 8ch +64V / -32V / 320mA
  • HVI: 8ch +64V / -32V / 320mA, 2ch ±64V / ±2A
  • Standard: HEAD 256 pins (Dig 128 pins + APU 128 pins)
  • Maximum: HEAD 592 pins (Dig 256 pins + APU 336 pins)

StarTec (Korea)

  • Semiconductor Tester Discrete Tester
  • Voltage, Current(2,000V, 100A)
  • Test Result Judgement

SPANDNIX Company Profile

Established

November 12, 1970

Capital

JPY 98  Million

Sales Volume

JPY 1.6 Billion(2016)

HQ Location

Tokorozawa City,  Saitama, Japan

C.E.O

Takahiro Seki

Employees

60 (including 4 Chinese engineers and sales)

SPANDNIX Company Profile

Old model

SX-1300,SX1600, SX2100

Series :  2000set~

Current model

SX-3000 Series :  400set~

SX-5000 Series :  500set~   

Tokorozawa HQ
Tokorozawa HQ
Tokorozawa Factory R&D Center
Tokorozawa Factory R&D Center

Prober & Handler

Wafer 테스트        Final 테스트

TEL (P8-XL & 12-XL)

  • Wafer Size: 4~8inch / 4~12inch
  • Die Size: 350um~76,000um
  • Resolution: Stage (0.4um)
  • Z-Stage(2um)
  • Maximum Speed: Stage (200 mm/s)
  • Z-Stage(40mm/s)

STI(AT-468)

  • 3D Inspection (Top, Bottom, Inpocket, Post Seal)
  • Test Site  8ea
  • Testable Size 2×2~12×12
  • Input : Bulk
  • Output : Tape and Reel
  • UPH: 30K

SRM(Z-248)

  • 3D Inspection (Top, Bottom, Inpocket, Post Seal)
  • Test Site  8ea
  • Testable Size 1×0.6~12×12
  • Input : Bulk
  • Output : Tape and Reel
  • UPH: 48K

KC8088

  • Test Site: ~8 Parallel
  • Testable Size: 3×3~50×50
  • Hot Chamber
  • Index time: 0.43 sec
  • Tray input Tray out

STI (Hexa-Maxx)

  • 3D Inspection (Top, Bottom, Inpocket,Post Seal)
  • Input : Tray
  • Output : Tape and Reel, Tray
  • UPH: 14K

Main Scope of Test Services

Wafer Level Test (CP / EDS)


Probe Card Design and Customization 

ㆍWafer-Level Electrical Characterization and Yield Analysis

ㆍProvision of Wafer Sort Data (including Yield Map)

Package Level Final Test (FT)


• Digital / Analog / Mixed Signal / Power IC Final Test

• Functional Test, Parametric Test, Burn-in Test

• Handling support by package type (Tray, Tape & Reel, Tube, etc.)

Reliability Test


• Supports various JEDEC standards including HTRB, HTGB, uHAST, PCT, TC, and HTSL

• Provides Pre/Post Test Data Analysis and Failure Analysis (FA) support


Custom Test Solution Development


• Development of Test Programs optimized for customer product characteristics

• Utilizing NI PXI-based test platforms and COTS (Commercial Off-The-Shelf) platforms

• Support for establishing a Turnkey Test Flow

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Test Service Capabilities and Development Scope

High-Speed, High-Precision Test Program Development

Secured specialized test know-how for power devices (SiC MOSFET / Diode / IGBT, etc.)

Expertise in optimizing Analog / Mixed Signal IC tests.

High-Reliability Testing Capability for High-Temp / High-Voltage Conditions

Providing feedback based on test data analysis to drive process improvements.

#2720, Sambo Techno Tower, 122, Jomaru-ro 385beon-gil, Wonmi-gu, Bucheon-si, Gyeonggi-do, 14556, Korea

Tel. 070-4349-0077  l  Fax. 02-6280-2023

E-mail. rootsemi@rootsemicon.co.kr


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